½×¤åºKn (^)
In the IC packaging and testing industry, short lead-time, high yield performance and excellence in quality are the major factors for competition. To achieve these goals, experienced and knowledgeable employees as well as a culture appreciating collaborative problem solving and knowledge sharing are essential. The case company realized and promoted the importance of collaborative problem solving and knowledge sharing. Currently, several collaborative problem solving and knowledge sharing activities can be observed in the case company. Although the case company appreciates and creates the culture of collaborative problem solving and knowledge sharing, several challenges remain to be addressed.
¡P Reuse of lessons learned knowledge (or tacit knowledge for short) seldom takes place.
¡P Retention of Lessons Learned knowledge is lacking.
¡P The availability of lessons learned knowledge is a concern.
To address the above-mentioned challenges faced by the case company, the purpose of this research is to develop and implement a knowledge management system. Specifically, an lessons learned knowledge repository will be constructed for capturing, retaining and reusing lessons learned knowledge. The goals of the target knowledge management system include facilitating efficient inter- and intra-departmental knowledge sharing and improving the knowledge availability that, in turn, leading to a productivity improvement. Empirical evaluations on the usability of the proposed system will be conducted and analyzed.
| Identifer | oai:union.ndltd.org:NSYSU/oai:NSYSU:etd-0802101-151605 |
| Date | 02 August 2001 |
| Creators | Chen, Rainbow |
| Contributors | none, none, none |
| Publisher | NSYSU |
| Source Sets | NSYSU Electronic Thesis and Dissertation Archive |
| Language | English |
| Detected Language | English |
| Type | text |
| Format | application/pdf |
| Source | http://etd.lib.nsysu.edu.tw/ETD-db/ETD-search/view_etd?URN=etd-0802101-151605 |
| Rights | unrestricted, Copyright information available at source archive |
Page generated in 0.002 seconds