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Insights into Crack Dynamics Governing Surface Quality during Spalling of Semiconductors

abstract: The rationale of this thesis is to provide a thorough understanding of spalling for semiconductor materials and develop a low temperature spalling technology that reduces the surface roughness of the spalled wafers for Photovoltaics applications. / Dissertation/Thesis / Doctoral Dissertation Materials Science and Engineering 2020

Identiferoai:union.ndltd.org:asu.edu/item:62897
Date January 2020
ContributorsGuimera Coll, Pablo (Author), Bertoni, Mariana I (Advisor), Meier, Rico (Committee member), Holman, Zachary (Committee member), Wang, Qing Hua (Committee member), Arizona State University (Publisher)
Source SetsArizona State University
LanguageEnglish
Detected LanguageEnglish
TypeDoctoral Dissertation
Format168 pages
Rightshttp://rightsstatements.org/vocab/InC/1.0/

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