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A programmed test sequence generation to detect and distinguish failures in a combinational circuit

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Identiferoai:union.ndltd.org:arizona.edu/oai:arizona.openrepository.com:10150/347832
Date January 1973
CreatorsHuang, George Huang-Liang, 1938-
PublisherThe University of Arizona.
Source SetsUniversity of Arizona
Languageen_US
Detected LanguageEnglish
Typetext, Thesis-Reproduction (electronic)
RightsCopyright © is held by the author. Digital access to this material is made possible by the University Libraries, University of Arizona. Further transmission, reproduction or presentation (such as public display or performance) of protected items is prohibited except with permission of the author.

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