Test strategies were developed to reduce the overall production testing cost of high-performance data converters. A static linearity testing methodology, aimed at reducing the test time of A/D converters, was developed. The architectural information of A/D converters was used, and specific codes were measured. To test a high-performance A/D converters using low-performance and low-cost test equipment a dynamic testing methodology was developed. This involved post processing of measurement data. The effect of ground bounce on accuracy of specification measurement was analyzed, and a test strategy to estimate the A/D converter specifications more accurately in presence of ground bounce noise was developed.
The proposed test strategies were simulated using behavioral modeling techniques and were implemented on commercially available A/D converter devices. The hardware experiments validated the proposed test strategies. The test cost analysis was done. It suggest that a significant reduction in cost can be obtained by using the proposed test methodologies for data converter production testing.
| Identifer | oai:union.ndltd.org:GATECH/oai:smartech.gatech.edu:1853/14552 |
| Date | 31 January 2007 |
| Creators | Goyal, Shalabh |
| Publisher | Georgia Institute of Technology |
| Source Sets | Georgia Tech Electronic Thesis and Dissertation Archive |
| Detected Language | English |
| Type | Dissertation |
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