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Ballistic Electron Emission Microscopy and Internal Photoemission Study on Metal Bi-layer/Oxide/Si, High-<i>k</i> Oxide/Si, and “End-on” Metal Contacts to Vertical Si Nanowires

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1. http://rave.ohiolink.edu/etdc/view?acc_num=osu1269521615

Identifer	oai:union.ndltd.org:OhioLink/oai:etd.ohiolink.edu:osu1269521615
Date	25 August 2010
Creators	Cai, Wei
Publisher	The Ohio State University / OhioLINK
Source Sets	Ohiolink ETDs
Language	English
Detected Language	English
Type	text
Source	http://rave.ohiolink.edu/etdc/view?acc_num=osu1269521615
Rights	unrestricted, This thesis or dissertation is protected by copyright: all rights reserved. It may not be copied or redistributed beyond the terms of applicable copyright laws.