In this thesis the methods of optical beam induced current (OBIC), multi-photon excitation, and confocal microscopy were employed to study InGaN LED¡¦s. Recently, important breakthrough and achievement have been made in the developments of InGaN based opto-electronic components. As a result, it is important to characterize the properties and the performance of InGaN based devices with various techniques. In this thesis, we have used 2-photon OBIC microscopy to observe various such LED¡¦s. We found that the LED¡¦s exhibit dotted pattern which can not be seen under 1-photon excitation. In addition, we have employed micro-spectroscopy to characterize the active layer of these LED¡¦s. These results will be discussed in this thesis in detail.
| Identifer | oai:union.ndltd.org:NSYSU/oai:NSYSU:etd-0626100-004332 |
| Date | 26 June 2000 |
| Creators | Huang, Mao-Kuo |
| Contributors | Wun-shain Fann, Sheng-Lung Huang, Wood-Hi Cheng, Fu-Jen Kao, Chi-Kuang Sun |
| Publisher | NSYSU |
| Source Sets | NSYSU Electronic Thesis and Dissertation Archive |
| Language | Cholon |
| Detected Language | English |
| Type | text |
| Format | application/pdf |
| Source | http://etd.lib.nsysu.edu.tw/ETD-db/ETD-search/view_etd?URN=etd-0626100-004332 |
| Rights | unrestricted, Copyright information available at source archive |
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