Digital microprocessor based relays are currently being utilized for safe, reliable and efficient operation of power systems. The overcurrent protection relay is the most extensively used component to safeguard power systems from the detrimental effects of faults. Wrong settings in overcurrent relay parameters can lead to false tripping or even bypassing fault conditions which can lead to a catastrophe. Therefore it is important to validate the settings of power protection equipment and to confirm its performance when subject to different fault conditions. This paper presents the modeling of an overcurrent relay in SimPowerSystems (\textsc {matlab}/Simulink). The overcurrent relay has the features of instantaneous, time definite and inverseĀ definite minimum time (IDMT) characteristics. A power system is modeled in SimPowerSystems and this overcurrent relay model is incorporated in the test case. The overall model is then simulated in real-time using Opal-RT's eMEGAsim real-time simulator to analyze the relay's performance when subjected to faults and with different characteristic settings in the relay model. Finally Hardware-in-the-Loop validation of the model is done by using the overcurrent protection feature in Schweitzer Engineering Laboratories Relay SEL-487E. The event reports generated by the SEL relays during Hardware-in-the-Loop testing are compared with the results obtained from the standalone testing and software model to validate the model. / <p>QC 20130215</p>
Identifer | oai:union.ndltd.org:UPSALLA1/oai:DiVA.org:kth-118339 |
Date | January 2012 |
Creators | Almas, Muhammad Shoaib, Leelaruji, Rujiroj, Vanfretti, Luigi |
Publisher | KTH, Elektriska energisystem, KTH, Elektriska energisystem, KTH, Elektriska energisystem, Montreal, QC |
Source Sets | DiVA Archive at Upsalla University |
Language | English |
Detected Language | English |
Type | Conference paper, info:eu-repo/semantics/conferenceObject, text |
Format | application/pdf |
Rights | info:eu-repo/semantics/openAccess |
Relation | IEEE Industrial Electronics Society. Annual Conference. Proceedings, 1553-572X, IECON 2012 - 38th Annual Conference on IEEE Industrial Electronics Society, p. 4789-4896 |
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