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Some aspects on dielectric breakdown in metal-silicon dioxide-silicon capacitors.

Lai Kam Kwong. / Thesis (M.Sc.)--Chinese University of Hong Kong. / Bibliography: leaves 86-89.

Identiferoai:union.ndltd.org:cuhk.edu.hk/oai:cuhk-dr:cuhk_320904
Date January 1974
ContributorsLai, Kam Kwong., Chinese University of Hong Kong Graduate School. Division of Electronics.
PublisherChinese University of Hong Kong
Source SetsThe Chinese University of Hong Kong
LanguageEnglish
Detected LanguageEnglish
TypeText, bibliography
Formatprint, [6], 89 leaves : ill. ; 28 cm.
RightsUse of this resource is governed by the terms and conditions of the Creative Commons “Attribution-NonCommercial-NoDerivatives 4.0 International” License (http://creativecommons.org/licenses/by-nc-nd/4.0/)

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