Methods for testing commercial off-the-shelf (COTS) digital devices at varying levels of complexity is presented and discussed as well as the results for testing a COTS SRAM, FRAM, and SoC using these methodologies in a pulsed dose rate environment at Little Mountain Test Facility (LMTF) and neutron testing at Los Alamos Neutron Science Center (LANSCE). Investigations at LMTF revealed a dependence in all three devices on the integrated dose of a single pulse of radiation, implying that the duration of radiation plays a significant role in the response. The test infrastructure necessary to dynamically access an FRAM at LMTF and time the access with the pulse of radiation allowed for the discovery of a new FRAM failure mode where an entire word of the FRAM becomes corrupted as well as selecting between two different failure modes based on the timing of the pulse. A novel component-based testing methodology for testing complicated SoCs is presented and used to report on the cross-sections of several components on the Xilinx MPSoC, including its DMA which has not previously been reported.
| Identifer | oai:union.ndltd.org:BGMYU2/oai:scholarsarchive.byu.edu:etd-10927 |
| Date | 19 April 2023 |
| Creators | Stirk, Wesley Raymond |
| Publisher | BYU ScholarsArchive |
| Source Sets | Brigham Young University |
| Detected Language | English |
| Type | text |
| Format | application/pdf |
| Source | Theses and Dissertations |
| Rights | https://lib.byu.edu/about/copyright/ |
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