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Modeling and scaling limitations of SiGe HBT low-frequency noise and oscillator phase noise

Dissertation (Ph.D.)--Auburn University, 2006. / Abstract. Vita. Includes bibliographic references (p.136-139).

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/244008567
Date January 2006
CreatorsTang, Jin, Niu, Guofu.
PublisherAuburn, Ala. ,
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish

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