From nanoscale to macroscale using the atomic force microscope to quantify the role of few-asperity contacts in adhesion

Description

Dissertation (Ph.D.)--Worcester Polytechnic Institute. / Keywords: Surface roughness; Surface forces; Van der Waals forces. Includes bibliographical references.

Links & Downloads

1. http://www.wpi.edu/Pubs/ETD/Available/etd-010906-204218/

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Additional Fields

Identifer	oai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/70246594
Date	January 2006
Creators	Thoreson, Erik J.
Source Sets	OCLC
Language	English
Detected Language	English
Source	Link to electronic dissertation