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The selection and single event upset testing of a DSP processor for a LEO satellite

Thesis (MScEng)--University of Stellenbosch, 2002. / ENGLISH ABSTRACT: After successful use of a DSP processor onboard the SUNSAT satellite, the need arose for
a faster floating-point processor. A list of possible processors was generated from various
selection criteria. Two suitable DSP processors were chosen, and because no radiation
information was available for one of them, the decision was made to perform radiation
tests on it. The procedures used to test the processor are described in detail so the same
methods can be used for future radiation tests. An error detection and correction circuit
was implemented to check and correct upsets in the on-chip memory of the DSP processor.
This ensures that the processor code and data stays intact. / AFRIKAANSE OPSOMMING: Na suksesvolle gebruik van 'n DSP verwerker aanboord die SUNSAT satelliet het die
behoefte ontstaan vir 'n vinniger wissel-punt verwerker. 'n Lys van moontlike verwerkers
is opgestel met die hulp van verskeie seleksie kriteria. Twee geskikte DSP verwerkers
is gekies, en omdat geen radiasie informasie vir die een beskikbaar was nie, is besluit
om radiasie toetse op hom te doen. Die prosedures gebruik om die verwerker te toets
word deeglik beskryf sodat dieselfde metodes in die toekom gebruik kan word. 'n Fout
deteksie en korreksie baan is geimplementeer om foute in die aanboord geheue van die
DSP verwerker op te spoor en te korrigeer. Dit verseker dat die verwerker se kode en data
intak bly.

Identiferoai:union.ndltd.org:netd.ac.za/oai:union.ndltd.org:sun/oai:scholar.sun.ac.za:10019.1/53171
Date03 1900
CreatorsBerner, Heiko
ContributorsBlanckenberg, M. M., Stellenbosch University. Faculty of Engineering. Dept. of Electrical and Electronic Engineering.
PublisherStellenbosch : Stellenbosch University
Source SetsSouth African National ETD Portal
Languageen_ZA
Detected LanguageUnknown
TypeThesis
Format180 p. : ill.
RightsStellenbosch University

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