<p>Nuclear particles hitting the silicon in a electronic device can cause a change in the data in a memory bit cell or in a flip-flop. The device is still working, but the data is corrupted and this is called a soft error. A soft error caused by a single nuclear particle is called a single event upset and is a growing problem. Research is ongoing at Saab aiming at how susceptible random access memories are to protons and neutrons.</p><p>This thesis describes the development of equipment for measuring cosmic-ray effects on DRAM in laboratories. The system is built on existing hardware with a FPGA as the core unit. A short history of soft errors is also given and what causes it. How a DRAM works and basic operation is explained and the difference between a SRAM. The result is a working system ready to be used.</p>
| Identifer | oai:union.ndltd.org:UPSALLA/oai:DiVA.org:liu-9764 |
| Date | January 2007 |
| Creators | Jonsson, Per-Axel |
| Publisher | Linköping University, Department of Electrical Engineering, Institutionen för systemteknik |
| Source Sets | DiVA Archive at Upsalla University |
| Language | English |
| Detected Language | English |
| Type | Student thesis, text |
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