Master of Science / Department of Physics / Carlos Trallero / This report presents the details of an electron time-of-flight (ETOF) spectrometer to be
used for characterizing ultrafast electric field pulses. The pulses will range in pulse-duration from
femtosecond to attoseconds and in wavelength from the far infrared (FIR) to the extreme ultra
violet (XUV). By measuring the photoelectrons in the presence of two electric fields and their
quantum interference we will be able to extract the amplitude and phase of the electric field. For
XUV pulses this is the well-known streaking and Reconstruction of Attosecond Beating by
Interference of Two-Photon Transition (RABITT) method.
The ETOF is based on a set of tunable electrostatic lenses capable of detecting 0-150 eV
electrons. In addition, we can selectively increase the photoelectron yield of the spectrum. The
precise tuning of the electrostatic lens system is done with a Genetic Algorithm (GA) with an
intensity fluctuation discriminator in the fitness.
| Identifer | oai:union.ndltd.org:KSU/oai:krex.k-state.edu:2097/32598 |
| Date | January 1900 |
| Creators | Timilsina, Pratap |
| Publisher | Kansas State University |
| Source Sets | K-State Research Exchange |
| Language | en_US |
| Detected Language | English |
| Type | Report |
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