Return to search

Characterization of substrate noise coupling, its impacts and remedies in RF and mixed-signal ICs

No description available.
Identiferoai:union.ndltd.org:OhioLink/oai:etd.ohiolink.edu:osu1160150387
Date16 November 2006
CreatorsHelmy, Ahmed
PublisherThe Ohio State University / OhioLINK
Source SetsOhiolink ETDs
LanguageEnglish
Detected LanguageEnglish
Typetext
Sourcehttp://rave.ohiolink.edu/etdc/view?acc_num=osu1160150387
Rightsunrestricted, This thesis or dissertation is protected by copyright: all rights reserved. It may not be copied or redistributed beyond the terms of applicable copyright laws.

Page generated in 0.0019 seconds