by Siu Wing Hon. / On t.p. T"c", "2", "3", and "7-x" are subscripts following "superconducting" in the title. / Parallel title in Chinese characters. / Thesis (M.Phil.)--Chinese University of Hong Kong, 1992. / Includes bibliographical references (leaves [79]-[80]). / Acknowledgement --- p.i / Abstract --- p.ii / Table of Content --- p.iii / Chapter Chapter 1 : --- Introduction / Chapter Chapter 2 : --- Growth of YBCO on Spinel / Chapter 2-1. --- Why Spinel --- p.2-1 / Chapter 2-2. --- Film Deposition Technique --- p.2-3 / Chapter 2-2.1 --- Magnetron Sputtering Technique --- p.2-3 / Chapter 2-2.2 --- Pulsed Laser Ablation --- p.2-4 / Chapter Chapter 3 : --- Composition Analysis by XRF / Chapter 3-1. --- Introduction --- p.3-1 / Chapter 3-2. --- Minimum Penetration Depth of EDX for YBCO film --- p.3-5 / Chapter 3-3. --- Thin Film Method and Thin Film Limit --- p.3-9 / Chapter 3-4. --- XRF Setup --- p.3-14 / Chapter 3-5. --- Calibration --- p.3-14 / Chapter 3-5.1 --- Chemical method --- p.3-18 / Chapter 3-5.2 --- Absorption Factor --- p.3-18 / Chapter 3-5.3 --- Diffusion Rate --- p.3-22 / Chapter 3-5.4 --- Justification of Thin Film Method --- p.3-22 / Chapter 3-5.5 --- Result of Calibration by Chemical Method --- p.3-24 / Chapter 3-5.6 --- Calibration by Rutherford Backscattering --- p.3-28 / Chapter 3-6. --- Discussion on XRF --- p.3-31 / Chapter 3-6.1 --- Effect of diffraction line by substrate on X-ray spectrum --- p.3-31 / Chapter 3-6.2 --- Stability of X-ray power supply and its influence on spectrum --- p.3-34 / Chapter Chapter 4 : --- Structural Analysis and Rapid Thermal Annealing / Chapter 4-1. --- XRD Setup --- p.4-1 / Chapter 4-2. --- XRD Analysis --- p.4-2 / Chapter 4-2.1 --- θ-2θ Scan --- p.4-1 / Chapter 4-2.2 --- Phi Scan --- p.4-3 / Chapter 4-2.3 --- Study of Diffraction Peak --- p.4-9 / Chapter 4-3. --- RTA and its influence on structure --- p.4-11 / Chapter 4-3.1 --- RTA Setup --- p.4-13 / Chapter 4-3.2 --- Structural Improvement by RTA --- p.4-13 / Chapter Chapter 5 : --- Conclusion --- p.5-1 / Chapter Appendix : A. --- Mathematical Derivation of Thin Film Limit / Chapter B. --- Powder Diffraction Patterns of YBCO system / Reference
| Identifer | oai:union.ndltd.org:cuhk.edu.hk/oai:cuhk-dr:cuhk_318949 |
| Date | January 1992 |
| Contributors | Siu, Wing Hon., Chinese University of Hong Kong Graduate School. Division of Physics. |
| Publisher | Chinese University of Hong Kong |
| Source Sets | The Chinese University of Hong Kong |
| Language | English |
| Detected Language | English |
| Type | Text, bibliography |
| Format | print, iv, [80] leaves : ill. ; 30 cm. |
| Rights | Use of this resource is governed by the terms and conditions of the Creative Commons “Attribution-NonCommercial-NoDerivatives 4.0 International” License (http://creativecommons.org/licenses/by-nc-nd/4.0/) |
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