Return to search

Built-in self-test design optimization for scan-based circuits

Thesis (Ph.D.)--University of Nebraska-Lincoln, 2006. / Title from title screen (site viewed May 23, 2007). PDF text: vi, 140 p. : ill. (some col.) ; 2.70Mb UMI publication number: AAT 3236905. Includes bibliographical references. Also available in microfilm and microfiche formats.

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/144446214
Date January 1900
CreatorsZhang, Sheng.
Publisher[Lincoln, Neb. : University of Nebraska-Lincoln,
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish

Page generated in 0.0177 seconds