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Optimal design of VLSI structures with built-in self test based on reduced pseudo-exhaustive testing

Thesis (Ph. D.)--Ohio University, November, 1992. / Title from PDF t.p.

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/212214432
Date January 1992
CreatorsPimenta, Tales Cleber.
PublisherOhio : Ohio University,
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish
SourceConnect to resource online

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