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A Behavioral Model of a Built-in Current Sensor for IDDQ Testing

IDDQ testing is one of the most effective methods for detecting defects in integrated
circuits. Higher leakage currents in more advanced semiconductor technologies have
reduced the resolution of IDDQ test. One solution is to use built-in current sensors. Several
sensor techniques for measuring the current based on the magnetic field or voltage drop
across the supply line have been proposed. In this work, we develop a behavioral model
for a built-in current sensor measuring voltage drop and use this model to better
understand sensor operation, identify the effect of different parameters on sensor
resolution, and suggest design modifications to improve future sensor performance.

Identiferoai:union.ndltd.org:tamu.edu/oai:repository.tamu.edu:1969.1/ETD-TAMU-2009-08-7097
Date14 January 2010
CreatorsGharaibeh, Ammar
Contributors(Hank) Walker, Duncan M., Hu, Jiang
Source SetsTexas A and M University
Languageen_US
Detected LanguageEnglish
TypeBook, Thesis, Electronic Thesis
Formatapplication/pdf

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