In this thesis, we investigate several inferential issues regarding the lifetime data from exponential distribution under different censoring schemes. For reasons of time constraint and cost reduction, censored sampling is commonly employed in practice, especially in reliability engineering. Among various censoring schemes, progressive Type-I censoring provides not only the practical advantage of known termination time but also greater flexibility to the experimenter in the design stage by allowing for the removal of test units at non-terminal time points. Hence, we first consider the inference for a progressively Type-I censored life-testing experiment with k uniformly spaced intervals. For small to moderate sample sizes, a practical modification is proposed to the censoring scheme in order to guarantee a feasible life-test under progressive Type-I censoring. Under this setup, we obtain the maximum likelihood estimator (MLE) of the unknown mean parameter and derive the exact sampling distribution of the MLE through the use of conditional moment generating function under the condition that the existence of the MLE is ensured. Using the exact distribution of the MLE as well as its asymptotic distribution and the parametric bootstrap method, we discuss the construction of confidence intervals for the mean parameter and their performance is then assessed through Monte Carlo simulations. Next, we consider a special class of accelerated life tests, known as step-stress
tests in reliability testing. In a step-stress test, the stress levels increase discretely at pre-fixed time points and this allows the experimenter to obtain information on the parameters of the lifetime distributions more quickly than under normal operating conditions. Here, we consider a k-step-stress accelerated life testing experiment with an equal step duration τ. In particular, the case of progressively Type-I censored data with a single stress variable is investigated. For small to moderate sample sizes, we introduce another practical modification to the model for a feasible k-step-stress test under progressive censoring, and the optimal τ is searched using the modified model. Next, we seek the optimal τ under the condition that the step-stress test proceeds to the k-th stress level, and the efficiency of this conditional inference is compared to the preceding models. In all cases, censoring is allowed at each change stress point iτ, i = 1, 2, ... , k, and the problem of selecting the optimal Tis discussed using C-optimality, D-optimality, and A-optimality criteria. Moreover, when a test unit fails, there are often more than one fatal cause for the failure, such as mechanical or electrical. Thus, we also consider the simple stepstress models under Type-I and Type-II censoring situations when the lifetime distributions corresponding to the different risk factors are independently exponentially distributed. Under this setup, we derive the MLEs of the unknown mean parameters of the different causes under the assumption of a cumulative exposure model. The exact distributions of the MLEs of the parameters are then derived through the use of conditional moment generating functions. Using these exact distributions as well as the asymptotic distributions and the parametric bootstrap method, we discuss the construction of confidence intervals for the parameters and then assess their performance through Monte Carlo simulations. / Thesis / Doctor of Philosophy (PhD)
| Identifer | oai:union.ndltd.org:mcmaster.ca/oai:macsphere.mcmaster.ca:11375/17644 |
| Date | 06 1900 |
| Creators | Han, Donghoon |
| Contributors | Balakrishnan, Narayanaswamy, Mathematics |
| Source Sets | McMaster University |
| Language | English |
| Detected Language | English |
| Type | Thesis |
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