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Models of electronic defects at the Si-SiO←2 interface

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1. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.237868

Identifer	oai:union.ndltd.org:bl.uk/oai:ethos.bl.uk:237868
Date	January 1989
Creators	Bull, Michael
Publisher	University of Oxford
Source Sets	Ethos UK
Detected Language	English
Type	Electronic Thesis or Dissertation