The Rayleigh law describes the linear dependence of the permittivity of a ferroelectric on the applied ac electric field amplitude due to irreversible motions of domain walls. We show that this gives rise to a new equivalent-circuit element predestined to fit the impedance spectra of ferroelectrics based on an accepted physical model. Such impedance spectroscopy is a powerful tool to obtain a dielectric and resistive representation of the entire sample structure. The superiority of the Rayleigh analysis based on impedance spectroscopy compared to the common single-frequency approach is demonstrated for a ferroelectric Si : HfO₂ thin film
| Identifer | oai:union.ndltd.org:DRESDEN/oai:qucosa:de:qucosa:81059 |
| Date | 05 October 2022 |
| Creators | Schenk, T., Hoffman, M., Pešić, M., Park, M. H., Richter, C., Schroeder, U., Mikolajick, T. |
| Publisher | American Physical Society (APS) |
| Source Sets | Hochschulschriftenserver (HSSS) der SLUB Dresden |
| Language | English |
| Detected Language | English |
| Type | info:eu-repo/semantics/acceptedVersion, doc-type:article, info:eu-repo/semantics/article, doc-type:Text |
| Rights | info:eu-repo/semantics/openAccess |
| Relation | 2331-7019, https://doi.org/10.1103/PhysRevApplied.10.064004, info:eu-repo/grantAgreement/Deutsche Forschungsgemeinschaft/Inferox/433647091//Ferroelektrisches Zirkonoxid für piezo- und pyroelektrische Bauelemente /Zeppelin |
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