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Asymmetric thermal cycles : a different approach to accelerated reliability assessment of microelectronic packages

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1. http://hdl.handle.net/1853/17873
2. 675165

Identifer	oai:union.ndltd.org:GATECH/oai:smartech.gatech.edu:1853/17873
Date	08 1900
Creators	Classe, Francis Christopher
Publisher	Georgia Institute of Technology
Source Sets	Georgia Tech Electronic Thesis and Dissertation Archive
Detected Language	English
Type	Thesis
Rights	Access restricted to authorized Georgia Tech users only.