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surface and depth-profiled chemical analysis of insulators after high temperature and/or high pressure treatments

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Identiferoai:union.ndltd.org:NSYSU/oai:NSYSU:etd-0719101-132337
Date19 July 2001
CreatorsLu, Hsin-Hsien
ContributorsAn-Chung Su, Tsu-Hsin Chang, Jin-Long Hong, Ming Chen
PublisherNSYSU
Source SetsNSYSU Electronic Thesis and Dissertation Archive
LanguageCholon
Detected LanguageEnglish
Typetext
Formatapplication/pdf
Sourcehttp://etd.lib.nsysu.edu.tw/ETD-db/ETD-search/view_etd?URN=etd-0719101-132337
Rightsunrestricted, Copyright information available at source archive

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