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Algorithms to determine the positioning of built-in self-test structures in VLSI circuits with references to an economic model

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1. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.280838

Identifer	oai:union.ndltd.org:bl.uk/oai:ethos.bl.uk:280838
Date	January 1989
Creators	Austwick, Michael Steven
Publisher	University of Hull
Source Sets	Ethos UK
Detected Language	English
Type	Electronic Thesis or Dissertation