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Ballistic Electron Emission Microscopy and Internal Photoemission Study on Metal Bi-layer/Oxide/Si, High-<i>k</i> Oxide/Si, and “End-on” Metal Contacts to Vertical Si Nanowires

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Identiferoai:union.ndltd.org:OhioLink/oai:etd.ohiolink.edu:osu1269521615
Date25 August 2010
CreatorsCai, Wei
PublisherThe Ohio State University / OhioLINK
Source SetsOhiolink ETDs
LanguageEnglish
Detected LanguageEnglish
Typetext
Sourcehttp://rave.ohiolink.edu/etdc/view?acc_num=osu1269521615
Rightsunrestricted, This thesis or dissertation is protected by copyright: all rights reserved. It may not be copied or redistributed beyond the terms of applicable copyright laws.

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