Return to search

Imprint template advances and surface modification, and defect analysis for step and flash imprint lithography

Not available / text

Identiferoai:union.ndltd.org:UTEXAS/oai:repositories.lib.utexas.edu:2152/1652
Date28 August 2008
CreatorsBailey, Todd Christopher
Source SetsUniversity of Texas
LanguageEnglish
Detected LanguageEnglish
TypeThesis
Formatelectronic
RightsCopyright is held by the author. Presentation of this material on the Libraries' web site by University Libraries, The University of Texas at Austin was made possible under a limited license grant from the author who has retained all copyrights in the works.

Page generated in 0.0019 seconds