Dynamical effects are known to reduce the signal to noise ratio in EMCD measurements making them highly dependent on sample thickness. Precession of the electron beam has been shown to reduce these effects in ordinary crystallography. This work investigates precession of the electron beam as a method of reducing the dynamical effects in EMCD using simulations. Simulations are run on BCC Fe in two and three beam conditions. The results show significant effects on the EMCD signal. However, whether these improve the signal quality seems dependent on sample orientation and thickness range. The initial findings reported here are promising and motivate further research.
Identifer | oai:union.ndltd.org:UPSALLA1/oai:DiVA.org:uu-412729 |
Date | January 2020 |
Creators | Forsberg, Arvid |
Source Sets | DiVA Archive at Upsalla University |
Language | English |
Detected Language | English |
Type | Student thesis, info:eu-repo/semantics/bachelorThesis, text |
Format | application/pdf |
Rights | info:eu-repo/semantics/openAccess |
Relation | MATVET-F ; 20001 |
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