The topic of this master thesis is the issue of measurement uncertainty of nano-CMM, specifically SIOS NMM-1 machine. Theoretical part of the thesis consists of basic measurement uncertainty definitions, description of approaches to CMM measurement uncertainty and differences between classical CMM and nano-CMM. For measurement uncertainty calculation of nano-CMM, two method are chosen and adapted – substitution method and Monte Carlo method. These are applied in practical part for measurement uncertainty calculation of SIOS NMM-1 machine. Part of the practical part is performed measurement on machine in laboratory at the Czech Metrology institute in Brno. The outcome of this thesis is determination of measurement uncertainty of SIOS NMM-1.
| Identifer | oai:union.ndltd.org:nusl.cz/oai:invenio.nusl.cz:377646 |
| Date | January 2018 |
| Creators | Brlica, Pavel |
| Contributors | Jankových, Róbert, Šrámek, Jan |
| Publisher | Vysoké učení technické v Brně. Fakulta strojního inženýrství |
| Source Sets | Czech ETDs |
| Language | Czech |
| Detected Language | English |
| Type | info:eu-repo/semantics/masterThesis |
| Rights | info:eu-repo/semantics/restrictedAccess |
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