Methods for examination of the crystal structure of crystalline materials include the X-Ray, neutron and synchrotron-radiation diffraction, electron backscattered diffraction in the scanning electron microscope, scanning transmission electron microscopy, transmission electron microscopy and focused ion beam microscopy. The scanning low energy electron microscopy (SLEEM) is less known as yet but already has proven itself very powerful tool for studies of the crystal lattice. By means of very slow electrons reflected from the sample and effectively detected in their full angular and energy distribution the crystalline structure is imaged at high spatial resolution and high contrast is obtained between differently oriented grains in polycrystals. Because of high sensitivity of the image signal to the inner potential distribution in the sample even details like subgrains or twins as well as strain at the microstructural level can be visualized. The aim of this thesis is to demonstrate the scanning low energy electron microscopy as an effective tool for investigation of wide range of materials like steels, non-ferrous alloys and ultra-fine grained materials.
| Identifer | oai:union.ndltd.org:nusl.cz/oai:invenio.nusl.cz:234186 |
| Date | January 2013 |
| Creators | Mikmeková, Šárka |
| Contributors | Kasl, Josef, Švejcar, Jiří, Frank, Luděk |
| Publisher | Vysoké učení technické v Brně. Fakulta strojního inženýrství |
| Source Sets | Czech ETDs |
| Language | Czech |
| Detected Language | English |
| Type | info:eu-repo/semantics/doctoralThesis |
| Rights | info:eu-repo/semantics/restrictedAccess |
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