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Class F And Inverse Class F Power Amplifier Subject To Electrical Stress Effect

This study investigated the Class F and inverse Class F RF power amplifier operating at 5.8 GHz. The major challenging issue in design and implementation of CMOS power transistor is the breakdown voltage especially in sub-micron CMOS technologies. In order to eliminate this problem a Cascode topologies were implemented to reduce the Drain-toSource voltage (stress). A Cascode Class F & Inverse Class F RF power amplifier were designed, and optimized in order to improve efficiency and reliability using 0.18µm CMOS technology process. A 50% decrease in the stress has been achieved in the Cascode class-F and Inverse class F amplifiers. The sensitivity and temperature effect were investigated using BSIM-4 model. Such an amplifier was designed and optimized for a good sensitivity. A substrate bias circuit was implemented to achieve a good sensitivity. Recommendations were made for future advancements for modification and optimization of the class F and inverse class F circuit by the application of other stress reduction strategies, and improvement of the substrate bias circuit for a better sensitivity.

Identiferoai:union.ndltd.org:ucf.edu/oai:stars.library.ucf.edu:etd-2890
Date01 January 2011
CreatorsSkaria, Giji
PublisherSTARS
Source SetsUniversity of Central Florida
LanguageEnglish
Detected LanguageEnglish
Typetext
Formatapplication/pdf
SourceElectronic Theses and Dissertations

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