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Photoluminescence excitation spectroscopy on InGaN/GaN multiple quantum wells grown on silicon substrates

We study the optical properties of InGaN/GaN multiple quantum wells grown on silicon (111) substrate with different buffer layers. Because of the lattice mismatch and mismatch in thermal expansion coefficient, there exists stresses in the nitride sample grown on silicon substrates, which influence the growth properties and optical properties. A set of buffer layers was proposed in order to reduce the stress in our samples. The influence on optical properties is investigated in our work.
In Raman spectra, we observed the characteristic phonon mode of GaN. According to the variation of E2 mode, the stress can be estimated. From our results, growing buffer layers can effectively reduce the stress in the sample. From temperature dependent and power dependent photoluminescence¡]PL) measurement, we found that appropriate buffer layers bring about less stress and better efficiency of luminescence. There are absorption of GaN and some vibrational behaviors in PLE spectra. According to the stokes shift calculated from temperature dependence PL and PLE spectra, we infer that the mechanism of recombination is not only carrier localization. The recombination is involved with the interaction of carriers and longitudinal optical phonons, and the stokes shift is independence on temperature.

Identiferoai:union.ndltd.org:NSYSU/oai:NSYSU:etd-0911107-120710
Date11 September 2007
CreatorsHsieh, Meng-hsueh
ContributorsWei-Hung Su, Chao -Yi Tai, Da-Reng Hang
PublisherNSYSU
Source SetsNSYSU Electronic Thesis and Dissertation Archive
LanguageCholon
Detected LanguageEnglish
Typetext
Formatapplication/pdf
Sourcehttp://etd.lib.nsysu.edu.tw/ETD-db/ETD-search/view_etd?URN=etd-0911107-120710
Rightscampus_withheld, Copyright information available at source archive

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