Return to search

A built-in self test (BIST) technique for single-event transient testing in digital circuits

Thesis (M. S. in Electrical Engineering)--Vanderbilt University, Aug. 2008. / Title from title screen. Includes bibliographical references.

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/245089595
Date January 2008
CreatorsBalasubramanian, Anitha,
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish
TypeElectronic dissertations.

Page generated in 0.0017 seconds