Electron beam induced carbon nanomasking used for selective electrochemical reactions on semiconductor surfaces

Description

Erlangen, Nürnberg, University, Diss., 2002. / Dateien im PDF-Format.

Links & Downloads

1. http://deposit.ddb.de/cgi-bin/dokserv?idn=972005498
2. http://www.opus.ub.uni-erlangen.de/opus/volltexte/2004/34/index.html

Tags

Rasterelektronenmikroskop

Additional Fields

Identifer	oai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/76652121
Date	January 1900
Creators	Djenizian, Thierry.
Publisher	[S.l. : s.n.,
Source Sets	OCLC
Language	English
Detected Language	English
Source	LF