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Semiconductor P-N Junction Space Charge Region Capacitance

The classical capacitance voltage characteristics based on the depletion approximation, is adequate at reverse bias, but introduces errors at high forward bias. Because of its inherent simplicity and compactness this classical depletion model is well studied and widely used in circuit simulators. In this work, a new model for the semiconductor space charge region (SCR) capacitance, based on physical justification, will be derived. This new model takes three input parameters, C0 , Vbi and m, thus eliminating the fitting parameter FC currently used in SPICE. This new model is applicable for any applied voltage and will be compared with the SCR capacitance extracted from the numerical device simulator PISCES, and with the SCR capacitance models proposed by Gummel and Poon and by DeGraaff and Klaassen.

Identiferoai:union.ndltd.org:pdx.edu/oai:pdxscholar.library.pdx.edu:open_access_etds-5660
Date04 December 1992
CreatorsHabib, Mohammad Humayun
PublisherPDXScholar
Source SetsPortland State University
Detected LanguageEnglish
Typetext
Formatapplication/pdf
SourceDissertations and Theses

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