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Spectroscopic Ellipsometry as a Versatile, Non-Contact Probe of Optical, Electrical, and Structural Properties in Thin Films: Applications in Photovoltaics

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1. http://rave.ohiolink.edu/etdc/view?acc_num=toledo1493148258156143

Identifer	oai:union.ndltd.org:OhioLink/oai:etd.ohiolink.edu:toledo1493148258156143
Date	January 2017
Creators	Junda, Maxwell M.
Publisher	University of Toledo / OhioLINK
Source Sets	Ohiolink ETDs
Language	English
Detected Language	English
Type	text
Source	http://rave.ohiolink.edu/etdc/view?acc_num=toledo1493148258156143
Rights	unrestricted, This thesis or dissertation is protected by copyright: all rights reserved. It may not be copied or redistributed beyond the terms of applicable copyright laws.