We use molecular beam deposition (MBD) system to grow CuAlSe2 thin film. The films have been characterized by electrical measurements but also by X-ray diffraction, electron probe microanalysis, optical measurements, scanning electron microscopy and photoluminescence. It is shown that CuAlSe2 thin film is chalcopyrite structure with a band gap of 2.65eV, p-type conductivity and the smallest resistivity is 1.26¡Ñ102(
| Identifer | oai:union.ndltd.org:NSYSU/oai:NSYSU:etd-0720104-180419 |
| Date | 20 July 2004 |
| Creators | Tsai, Shiang-hui |
| Contributors | Bae-heng Tseng, Bing-hwait Hwang, Huey-liang Hwang, Mau-phon Houng |
| Publisher | NSYSU |
| Source Sets | NSYSU Electronic Thesis and Dissertation Archive |
| Language | Cholon |
| Detected Language | English |
| Type | text |
| Format | application/pdf |
| Source | http://etd.lib.nsysu.edu.tw/ETD-db/ETD-search/view_etd?URN=etd-0720104-180419 |
| Rights | not_available, Copyright information available at source archive |
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