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Fabrication and Characterization of Polycrystallin Silicon Thin-Film Transistor and Nonvolatile Memory with Block Oxide and Body-tie

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Identiferoai:union.ndltd.org:NSYSU/oai:NSYSU:etd-0725109-174317
Date25 July 2009
CreatorsTseng, Hung-Jen
ContributorsChun-Hsing shih, Yao-Tsung Tsai, Wen-Kuan Yeh, James B. Kuo, Jyi-Tsong Lin
PublisherNSYSU
Source SetsNSYSU Electronic Thesis and Dissertation Archive
LanguageCholon
Detected LanguageEnglish
Typetext
Formatapplication/pdf
Sourcehttp://etd.lib.nsysu.edu.tw/ETD-db/ETD-search/view_etd?URN=etd-0725109-174317
Rightsnot_available, Copyright information available at source archive

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