Enhanced defect generation in gate oxides of P-channel MOS transistors in the presence of water

Description

Thesis (M. S. in Electrical Engineering)--Vanderbilt University, May 2009. / Title from title screen. Includes bibliographical references.

Links & Downloads

1. http://etd.library.vanderbilt.edu/ETD-db/available/etd-02062009-162823/

Tags

Additional Fields

Identifer	oai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/302268836
Date	January 2009
Creators	Dasgupta, Aritra.
Source Sets	OCLC
Language	English
Detected Language	English
Type	Electronic dissertations.