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Dosimetric Effects Near Implanted Vascular Access Ports Under External Electron Beam Radiation

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Identiferoai:union.ndltd.org:OhioLink/oai:etd.ohiolink.edu:wright1284927583
Date28 October 2010
CreatorsColl Segarra, David
PublisherWright State University / OhioLINK
Source SetsOhiolink ETDs
LanguageEnglish
Detected LanguageEnglish
Typetext
Sourcehttp://rave.ohiolink.edu/etdc/view?acc_num=wright1284927583
Rightsunrestricted, This thesis or dissertation is protected by copyright: all rights reserved. It may not be copied or redistributed beyond the terms of applicable copyright laws.

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