Return to search

Use of modeling to characterize phenology and associated traits among wheat cultivars

Hohenheim, Univ., Diss., 2008.

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/315726868
Date January 2008
CreatorsHerndl, Markus,
Publisher[S.l. : s.n.],
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish
TypeOnline-Publikation.
SourceKostenfrei

Page generated in 0.0019 seconds