This thesis is focused on Radiation damage of samples in low-voltage transmission electron microscopy. In thesis is general description of transmission electron microscopy and their important parts. There is described how samples are damaged by primary electron beam and how samples for transmission electron microscopy are prepared and which degradation occurs from the point of view materials of sample and time dose of electrons from primary electron beam.
| Identifer | oai:union.ndltd.org:nusl.cz/oai:invenio.nusl.cz:400992 |
| Date | January 2019 |
| Creators | Vykydal, Václav |
| Contributors | Valterová, Eva, Kolář, Radim |
| Publisher | Vysoké učení technické v Brně. Fakulta elektrotechniky a komunikačních technologií |
| Source Sets | Czech ETDs |
| Language | Czech |
| Detected Language | English |
| Type | info:eu-repo/semantics/masterThesis |
| Rights | info:eu-repo/semantics/restrictedAccess |
Page generated in 0.0018 seconds