Here explored is a method by which designers can use the tool of topology optimization to numerically improve barriers to reverse engineering. Recently developed metrics, which characterize the time (T) to reverse engineer a product, enable this optimization. A key parameter use din the calculation of T is information content (K). The method presented in this thesis pursues traditional topology optimization objectives while simultaneously maximizing K, and thus T, in the resulting topology. This thesis presents new algorithms to 1) evaluate K for any topology, 2)increase K for a topology by manipulating macro-scale geometry and micro-scale crystallographic information for each element, and 3) simultaneously maximize K and minimize structural compliance(a traditional topology optimization objective). These algorithms lead designers to desirable topologies with increased barriers to reverse engineering. It is concluded that barriers to reverse engineering can indeed be increased without sacrificing the desirable structural characteristic of compliance. This has been shown through the example of a novel electrical contact for a consumer electronics product.
| Identifer | oai:union.ndltd.org:BGMYU2/oai:scholarsarchive.byu.edu:etd-4786 |
| Date | 15 May 2013 |
| Creators | LeBaron, Devin Donald |
| Publisher | BYU ScholarsArchive |
| Source Sets | Brigham Young University |
| Detected Language | English |
| Type | text |
| Format | application/pdf |
| Source | Theses and Dissertations |
| Rights | http://lib.byu.edu/about/copyright/ |
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