In this talk I will introduce atomic-scale X-ray photon correlation spectroscopy, a synchrotron-based
experimental method that allows us to follow the atoms during their movement in real time in a statistical
sense, with a sensitivity to jump rates on timescales of seconds to hours [1]. I will review the theoretical
concepts and discuss the relations to alternative atomically-resolved methods. Further, I will give an
overview on our results in crystalline and amorphous matter, comprising metals, semiconductors and
insulators.
| Identifer | oai:union.ndltd.org:DRESDEN/oai:qucosa:de:qucosa:38055 |
| Date | 30 January 2020 |
| Creators | Leitner, Michael |
| Source Sets | Hochschulschriftenserver (HSSS) der SLUB Dresden |
| Language | English |
| Detected Language | English |
| Type | info:eu-repo/semantics/acceptedVersion, doc-type:article, info:eu-repo/semantics/article, doc-type:Text |
| Rights | info:eu-repo/semantics/openAccess |
| Relation | 9, urn:nbn:de:bsz:15-qucosa2-378382, qucosa:37838 |
Page generated in 0.0016 seconds