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Measurement of Electromagnetic Interference Rejection Ratio for Precision Instrumentation Amplifiers

Electro-Magnetic Interference(EMI) degrades the perfomance of electronic systems.
So, Amplifiers which are the basic building blocks used in the front-end of analog and mixed-signal Integrated Circuits (ICs) must be evaluated for EMI. This work
introduces the most intriguing figure of merit, Electro-Magnetic Interference Rejection Ratio (EMIRR) to measure the EMI immunity of precision Instrumentation Amplifiers
(INAs) that helps to select the EMI robust INAs for EMI critical applications. In this work, a new EMIRR measurement setup is implemented to measure the
immunity of INAs for conducted EMI ranging from 10 MHz to 3 GHz. The shift in the DC offset voltage generated at the output of the INA due to RF rectification, is used to
compute EMIRR. As part of the setup, the hardware evaluation board is designed and an automation test software is developed to run EMIRR measurements. Furthermore,
EMIRR measurements are performed on several INAs with different specifications to compare and rank them on their EMI immunity levels. Additionally, with the help of
EMIRR metric, suitable INAs for developing EMI-sensitive applications are proposed.
Finally, the influence of amplifier bandwidth, the input capacitance, 50 Ω termination at the end of RF input trace, INA package parasitics and EMI filter bandwidth on
EMIRR is analyzed with the measurement results.

Identiferoai:union.ndltd.org:DRESDEN/oai:qucosa:de:qucosa:79003
Date29 April 2022
CreatorsUdapudi, Preeti
ContributorsHardt, Wolfram, Harradi, Reda, Kammermayer, Patrick, Technische Universität Chemnitz
Source SetsHochschulschriftenserver (HSSS) der SLUB Dresden
LanguageEnglish
Detected LanguageEnglish
Typeinfo:eu-repo/semantics/publishedVersion, doc-type:masterThesis, info:eu-repo/semantics/masterThesis, doc-type:Text
Rightsinfo:eu-repo/semantics/openAccess

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