Recently, the ripple phenomena of liquid crystal display module were occurred frequently after burning machine test. The phenomena were mainly caused by the non-uniformity of the flatness of light guide plate. But, it is difficult to detect the ripple phenomena when the light guide plate is in a free state. It is usually can be detected until the burning machine test of liquid crystal display module was finished. But it will cost massive manpower and the physical resource wasting in this process.
In this study, the through analyses of flatness variations of light guide plate in its free state, in the back light module, and in the liquid crystal display module after the burning machine test, respectively, were executed. Also, the effects of variations of process factors of a light guide plate on the ripple phenomena were studied. It is hoped to achieve the purpose that one can control the flatness of light guide plate in the initial stage so that the ripple phenomena will no longer occur.
| Identifer | oai:union.ndltd.org:NSYSU/oai:NSYSU:etd-0108108-173515 |
| Date | 08 January 2008 |
| Creators | Hu, Chun-Chi |
| Contributors | rhsun, chchien, taiping |
| Publisher | NSYSU |
| Source Sets | NSYSU Electronic Thesis and Dissertation Archive |
| Language | Cholon |
| Detected Language | English |
| Type | text |
| Format | application/pdf |
| Source | http://etd.lib.nsysu.edu.tw/ETD-db/ETD-search/view_etd?URN=etd-0108108-173515 |
| Rights | unrestricted, Copyright information available at source archive |
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