The main purpose of this research is to analyze and improve manufacturing process of chip resistor . To startup research by collecting chip resistor related thesises and patents, and as a result, discover most research paper are focused on structure and material, seldom found information related to manufacturing and process. As a matter of fact, manufacturing and process is crucial for mass production.
Continued by analyzing chip resistor's structure and manufacture process, use defect sample collected from current manufacturing. Apply functional analysis to explore manufacturing system and environment. Base on analysis on functional structure and the limitation of structure, propose three ways of changing the processing sequence which provide improvement. In one case, after been trail run, it can actually reduce defect of manufacturing and speedup the operation flow.
List designing and operating operable of detail stage, according to equipment jig and product dimension explore approach, choose a approach optimum what it raise efficiency and improve defect of chip resistor.
Analyze resistance distribution and reliability test after test batch, confirm chip resistor¡¦s function and specification. Analyze defect rate of production ramp-up last.
Result of study, provide optimum procedure could be reduce defect rate. Whole process of study, compare defect rate of current and optimum approach, optimum approach could be reduce defect rate from 8.5¢H to 1.3¢H.
| Identifer | oai:union.ndltd.org:NSYSU/oai:NSYSU:etd-0215108-021318 |
| Date | 15 February 2008 |
| Creators | Chen, Tai-wei |
| Contributors | Wen-Tung Chien, Chung-Chun Wu, Cheng-Ho Hsu, Yaw-Hong Kang |
| Publisher | NSYSU |
| Source Sets | NSYSU Electronic Thesis and Dissertation Archive |
| Language | Cholon |
| Detected Language | English |
| Type | text |
| Format | application/pdf |
| Source | http://etd.lib.nsysu.edu.tw/ETD-db/ETD-search/view_etd?URN=etd-0215108-021318 |
| Rights | not_available, Copyright information available at source archive |
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