The attenuated total reflection (ATR) method and the scattering spectrum analysis are used to study the effects due to the surface plasma of Ag nanoparticles. A slide is coated with a thin Ag film of thickness about 40nm and anneals the sample few minutes at 197¢XC. The Ag film is thus congregated to be a rough surface. By ATR(with the slide attached to the back of the prism), the intensity of the total refection light and the reflective angle are measured. Then we can determine the dielectric coefficient of the rough Ag surface. We also coat a thin Ag film about 8nm on the ITO glass and anneal the sample. The thin Ag film is thus congregated to be nanoparticles. We discuss the effects due to the surface plasma excited on the Ag nanoparticles by analyzing the absorbance and scattering spectrums from Ag nanoparticles in liquid crystals environment.
| Identifer | oai:union.ndltd.org:NSYSU/oai:NSYSU:etd-0727106-115501 |
| Date | 27 July 2006 |
| Creators | Lin, Wen-xiang |
| Contributors | Andy Y.G. Fuh, Cheng Tien, Ming-shan Tsai, Der-jun Jang, I-min Jiang |
| Publisher | NSYSU |
| Source Sets | NSYSU Electronic Thesis and Dissertation Archive |
| Language | Cholon |
| Detected Language | English |
| Type | text |
| Format | application/pdf |
| Source | http://etd.lib.nsysu.edu.tw/ETD-db/ETD-search/view_etd?URN=etd-0727106-115501 |
| Rights | withheld, Copyright information available at source archive |
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