Standard methodologies exist for testing and characterizing digital circuits but the
same cannot be said of analog circuits. Though much theoretical work has been done to
model the linear and nonlinear aspects of analog circuits, a firm practical background for
the design of testable analog cells has yet to be set. The industry largely looks for solutions
wherein some form of built in self-test (BIST) can be incorporated into the analog circuits
to make the testing at the manufacturing level easy and accurate. Since the testers in the
industry are generally digital, test circuits that use logic levels at the output to make
measurements are attractive.
This thesis examines the design of such test circuits for one specific analog circuit,
the opamp. Test circuits to measure the gain, gain-bandwidth product, phase response and
the slew rate of the opamp have been designed and experimental results are presented. The
main advantages of these tests are that they are simple, fast, accurate and easy to
incorporate in an integrated circuit. / Graduation date: 1994
| Identifer | oai:union.ndltd.org:ORGSU/oai:ir.library.oregonstate.edu:1957/35768 |
| Date | 22 June 1993 |
| Creators | Ramamurthy, Karthik |
| Contributors | Kenney, John G. |
| Source Sets | Oregon State University |
| Language | en_US |
| Detected Language | English |
| Type | Thesis/Dissertation |
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