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Opamp characterization techniquesRamamurthy, Karthik 22 June 1993 (has links)
Standard methodologies exist for testing and characterizing digital circuits but the
same cannot be said of analog circuits. Though much theoretical work has been done to
model the linear and nonlinear aspects of analog circuits, a firm practical background for
the design of testable analog cells has yet to be set. The industry largely looks for solutions
wherein some form of built in self-test (BIST) can be incorporated into the analog circuits
to make the testing at the manufacturing level easy and accurate. Since the testers in the
industry are generally digital, test circuits that use logic levels at the output to make
measurements are attractive.
This thesis examines the design of such test circuits for one specific analog circuit,
the opamp. Test circuits to measure the gain, gain-bandwidth product, phase response and
the slew rate of the opamp have been designed and experimental results are presented. The
main advantages of these tests are that they are simple, fast, accurate and easy to
incorporate in an integrated circuit. / Graduation date: 1994
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High speed buffers for op-amp characterizationRangan, Giri N. K. 22 June 1993 (has links)
The feasibility of developing test circuits to perform in-circuit testing of analog
circuits is investigated in this thesis. A modular approach to analog testing has been
adopted. Accordingly, the testing of an operational amplifier, which is a basic building
block in analog circuits, is addressed. One convenient technique for measuring the frequency
response of an op-amp requires a unity gain buffer to be inserted into its feedback
loop. This buffer has to be simple in construction, small and accurate. Two buffer circuits
that satisfy these requirements are described in this thesis. Enhanced slewing techniques
are devised to achieve increased levels of performance. The buffers were integrated with
an op-amp into a test chip. Digital logic is used to provide controllability and accessibility
to each of the buffers and the op-amp so that they can characterized separately.
The performance of the enhanced slewing buffers was verified with measurements
performed on the test chip. The performance of the buffers conformed well with the simulated
values. The buffers exhibited excellent settling times even while driving large capacitive
loads. Their output swing and distortion performance were good for inputs as large as
2 V peak-to-peak values. / Graduation date: 1994
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